Measurement Science and Technology

ISSNs: 0957-0233

Additional searchable ISSN (Electronic): 1361-6501

IOP Publishing Ltd, United Kingdom

BFI (2017): BFI-level 2, Scopus rating (2016): CiteScore 1.75 SJR 0.668 SNIP 1.173, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed yes

Central database

Journal

  1. 2017
  2. Published
  3. Published
  4. Published

    Reduction of variable-truncation artifacts from beam occlusion during in situ x-ray tomography : Paper. / Borg, Leise; Jørgensen, Jakob Sauer; Frikel, Jürgen; Sporring, Jon.

    In: Measurement Science and Technology, Vol. 28, No. 12, 124004, 2017.

    Publication: Research - peer-reviewJournal article – Annual report year: 2017

  5. Published

    SparseBeads data: benchmarking sparsity-regularized computed tomography. / Jørgensen, Jakob Sauer; Coban, Sophia B.; Lionheart, William R. B.; McDonald, Samuel A.; Withers, Philip J.

    In: Measurement Science and Technology, Vol. 28, No. 12, 124005, 2017.

    Publication: Research - peer-reviewJournal article – Annual report year: 2017

  6. 2015
  7. Published

    Characterization of positional errors and their influence on micro four-point probe measurements on a 100 nm Ru film. / Kjær, Daniel; Hansen, Ole; Østerberg, Frederik Westergaard; Henrichsen, Henrik Hartmann; Markvardsen, Christian; Nielsen, Peter Folmer; Petersen, Dirch Hjorth.

    In: Measurement Science and Technology, Vol. 26, No. 9, 2015, p. 095005.

    Publication: Research - peer-reviewJournal article – Annual report year: 2015

  8. Published

    Comparison of optical methods for surface roughness characterization. / Feidenhans'l, Nikolaj Agentoft; Hansen, Poul Erik; Pilny, Lukas; Madsen, Morten H.; Bissacco, Giuliano; Petersen, Jan C.; Taboryski, Rafael J.

    In: Measurement Science and Technology, Vol. 26, No. 8, 085208, 2015.

    Publication: Research - peer-reviewJournal article – Annual report year: 2015

  9. Published

    Fast static field CIPT mapping of unpatterned MRAM film stacks. / Kjær, Daniel; Hansen, Ole; Henrichsen, Henrik Hartmann; Chenchen, Jacob Wang; Nørgaard, Kristian Petersen; Nielsen, Peter Folmer; Petersen, Dirch Hjorth.

    In: Measurement Science and Technology, Vol. 26, No. 4, 2015, p. 045602.

    Publication: Research - peer-reviewJournal article – Annual report year: 2015

  10. 2014
  11. Published

    Estimation of axial stiffness of plant fibres from compaction of non-woven mats. / Gamstedt, E. K.; Bommier, E.; Madsen, Bo.

    In: Measurement Science and Technology, Vol. 25, No. 3, 035601, 2014.

    Publication: Research - peer-reviewJournal article – Annual report year: 2014

  12. Published

    Influence of light sheet separation on SPIV measurement in a large field spanwise plane. / Foucaut, J M; Coudert, S.; Braud, C.; Velte, Clara Marika.

    In: Measurement Science and Technology, Vol. 25, No. 3, 035304, 2014.

    Publication: Research - peer-reviewJournal article – Annual report year: 2014

  13. Published

    Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology. / Tan, Ye; Kiekens, Kim; Welkenhuyzen, Frank; Angel, Jais Andreas Breusch; De Chiffre, Leonardo; Kruth, Jean-Pierre; Dewulf, Wim.

    In: Measurement Science and Technology, Vol. 25, No. 6, 2014, p. 064014.

    Publication: Research - peer-reviewJournal article – Annual report year: 2014

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