Materials Characterization

ISSNs: 1044-5803

Elsevier Inc., United States

FI (2012): 1, ISI indexed (2012): yes

Central database

Journal

Publications

(8)

Published
The three dimensional X-ray diffraction technique
Publication: Research - peer-review › Journal article – Annual report year: 2012
Published
Plastic deformation of submicron-sized crystals studied by in-situ Kikuchi diffraction and dislocation imaging
Publication: Research - peer-review › Journal article – Annual report year: 2012
Published
Grain-resolved elastic strains in deformed copper measured by three-dimensional X-ray diffraction
Publication: Research - peer-review › Journal article – Annual report year: 2011

ID: 96515