Journal of Microscopy

ISSNs: 0022-2720

Additional searchable ISSN (Electronic): 1365-2818

Wiley-Blackwell Publishing Ltd., United Kingdom

BFI (2017): BFI-level 1, Scopus rating (2016): CiteScore 1.9 SJR 0.734 SNIP 0.852, ISI indexed (2013): ISI indexed yes, Web of Science (2017): Indexed Yes

Central database

Journal

  1. 2017
  2. Published

    A method to characterize the roughness of 2-D line features: recrystallization boundaries. / Sun, Jun; Zhang, Yubin; Dahl, Anders Bjorholm; Conradsen, Knut; Juul Jensen, Dorte.

    In: Journal of Microscopy, Vol. 265, No. 3, 2017, p. 313–321.

    Publication: Research - peer-reviewJournal article – Annual report year: 2016

  3. Published

    Lattice constant measurement from electron backscatter diffraction patterns. / Saowadee, Nath; Agersted, Karsten; Bowen, Jacob R.

    In: Journal of Microscopy, Vol. 266, No. 2, 2017, p. 200-210.

    Publication: Research - peer-reviewJournal article – Annual report year: 2017

  4. 2013
  5. Published

    Ion beam polishing for three-dimensional electron backscattered diffraction. / Saowadee, Nath; Agersted, Karsten; Ubhi, H.S.; Bowen, Jacob R.

    In: Journal of Microscopy, Vol. 249, No. 1, 2013, p. 36-40.

    Publication: Research - peer-reviewJournal article – Annual report year: 2013

  6. Published
  7. 2012
  8. Published

    Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia. / Saowadee, Nath; Agersted, Karsten; Bowen, Jacob R.

    In: Journal of Microscopy, Vol. 246, No. 3, 2012, p. 279-286.

    Publication: Research - peer-reviewJournal article – Annual report year: 2012

  9. 2011
  10. Published

    Geometrical characterization of interconnected phase networks in three dimensions. / Jørgensen, Peter Stanley; Hansen, Karin Vels; Larsen, Rasmus; Bowen, Jacob R.

    In: Journal of Microscopy, Vol. 244, No. 1, 2011, p. 45-58.

    Publication: Research - peer-reviewJournal article – Annual report year: 2011

  11. Multiscale iterative voting for differential analysis of stress response for 2D and 3D cell culture models. / Han, Ju; Chang, Hang; Yang, Q.; Fontenay, Gerald V.; Groesser, Torsten; Barcellos-Hoff, Mary Helen; Parvin, Bahram.

    In: Journal of Microscopy, Vol. 241, No. 3, 2011, p. 315–326.

    Publication: Research - peer-reviewJournal article – Annual report year: 2011

  12. 2010
  13. Published

    An automated and highly efficient method for counting and measuring fluorescent foci in rod-shaped bacteria. / Nielsen, Henrik Jørck; Hansen, Flemming G.

    In: Journal of Microscopy, Vol. 239, No. 3, 2010, p. 194-199.

    Publication: Research - peer-reviewJournal article – Annual report year: 2010

  14. 2008
  15. Three‐dimensional EBSD study on the relationship between triple junctions and columnar grains in electrodeposited Co–Ni films. / da Silva Fanta, Alice Bastos; Zaefferer, S.; Raabe, D.

    In: Journal of Microscopy, Vol. 230, No. 3, 2008, p. 487-498.

    Publication: Research - peer-reviewJournal article – Annual report year: 2008

  16. Published

    Three-dimensional shapes and spatial distributions of Pt and PtCr catalyst nanoparticles on carbon black. / Gontard, Lionel Cervera; Dunin-Borkowski, Rafal E.; Ozkaya, D.

    In: Journal of Microscopy, Vol. 232, No. 2, 2008, p. 248-259.

    Publication: Research - peer-reviewJournal article – Annual report year: 2008

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