Journal of Microscopy
ISSNs: 0022-2720
Wiley-Blackwell Publishing Ltd., United Kingdom
FI (2012): 1, ISI indexed (2012): yes
Central database
Journal
Publications
(12)- Published
Ion beam polishing for three-dimensional electron backscattered diffraction
Publication: Research - peer-review › Journal article – Annual report year: 2013
- Published
The complementary use of electron backscatter diffraction and ion channelling imaging for the characterization of nanotwins
Publication: Research - peer-review › Journal article – Annual report year: 2013
- Published
Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia
Publication: Research - peer-review › Journal article – Annual report year: 2012
ID: 82869