Applied Optics
ISSNs: 1559-128X, 0003-6935, 00036935
Optical Society of America, United States
FI (2012): 1, ISI indexed (2012): no
Central database
Journal
- 1994
- Published
Remote sensing of wind velocity and strength of refractive turbulence using a two-spatial-filter receiver. / Hanson, Steen Grüner; Churnside, J.H.; Wilson, J.J.
In: Appl. Opt., Vol. 33, 1994, p. 5859-5868.Publication: Research › Journal article – Annual report year: 1994
- 1993
- Published
Dark spatial solitons in bacteriorhodopsin thin films. / Ramanujam, P.S.; Lindvold, L.
In: Appl. Opt., Vol. 32, 1993, p. 6656-6658.Publication: Research › Journal article – Annual report year: 1993
- Published
Laser velocimeters: Lower limits to uncertainty. / Lading, L.; Edwards, R.V.
In: Appl. Opt., Vol. 32, 1993, p. 3855-3866.Publication: Research › Journal article – Annual report year: 1993
- 1992
- Published
Compact photorefractive correlator for robotic applications. / Rajbenbach, H.; Bann, S.; Réfrégier, P.; Joffre, P.; Huignard, J.-P.; Buchkremer, H.-S.; Skov Jensen, A.; Rasmussen, E.; Brenner, K.-H.; Lohman, G.
In: Appl. Opt., Vol. 31, 1992, p. 5666-5674.Publication: Research › Journal article – Annual report year: 1992
- 1991
- Published
Electron micrography and x-ray study of dip-lacquered LiF (220). / Palmari, J.; Rasigni, M.; Rasigni, G.; Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.
In: Applied Optics, Vol. 30, No. 25, 1991, p. 3667-3672.Publication: Research - peer-review › Journal article – Annual report year: 1991
- 1989
- Published
Extreme UV and X-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography. / Lab. de Chimie-Phys., Univ. Pierre et Marie Curie, Paris France; Lab. de Chimie-Phys., Univ. Pierre et Marie Curie, Paris France; Lab. de Chimie-Phys., Univ. Pierre et Marie Curie, Paris France; Lab. de Chimie-Phys., Univ. Pierre et Marie Curie, Paris France; Christensen, Finn Erland; Hornstrup, Allan.
In: Applied Optics, Vol. 28, No. 10, 1989, p. 1763-1772.Publication: Research - peer-review › Journal article – Annual report year: 1989
- 1988
- Published
Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a triple-axis X-ray diffractometer. / Christensen, Finn Erland; Hornstrup, Allan; Schnopper, H. W.
In: Applied Optics, Vol. 27, No. 8, 1988, p. 1548-1557.Publication: Research - peer-review › Journal article – Annual report year: 1988
- 1987
- Published
Transformation of Image Positions, Rotations, and Sizes into Shift Parameters. / Skov Jensen, A.; Lindvold, L.; Rasmussen, E.
In: Applied Optics, Vol. 26, No. 9, 1987, p. 1775-1781.Publication: Research › Journal article – Annual report year: 1987
- 1985
- Published
Doubly curved imaging Bragg crystal spectrometer for X-ray astronomy. / Byrnak, B. P.; Christensen, Finn Erland; Westergaard, Niels Jørgen Stenfeldt; Schnopper, H. W.
In: Applied Optics, Vol. 24, No. 16, 1985, p. 2543-2547.Publication: Research - peer-review › Journal article – Annual report year: 1985
- 1984
- Published
Diffraction-Limited Lidars: the Impact of Refractive Turbulence. / Lading, Lars; Hanson, Steen Grüner; Jensen, Arne Skov.
In: Applied Optics, Vol. 23, No. 15, 1984, p. 2492-2497.Publication: Research - peer-review › Journal article – Annual report year: 1984