Oxford Instruments EBSD Symposium
Activity: Participation in conference/workshop/course/seminar › Participation in workshop, seminar, course
Jacob R. Bowen - Speaker, 24 May 2012
FIB Damage and Polishing in 3DEBSD of ceramic materials
- Technical University of Denmark
- Department of Energy Conversion and Storage
- Imaging and Structural Analysis
Conference
| Conference | Oxford Instruments EBSD Symposium |
|---|---|
| Country | Germany |
| City | Weisbaden |
| Period | 23-05-12 → 24-05-12 |
Projects
Publications
Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia
Publication: Research - peer-review › Journal article – Annual report year: 2012
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ID: 8080504