IEEE-NEMS 2008

Activity: Attending an eventParticipating in or organising a conference

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Au Nanoparticle Detection using Silicon Micro/Nano mechanical devices with Integrated Strain Gauge Readout

Place: IEEE NEMS 2008. Sanya, China

Meng Tang - Participant

Au Nanoparticle Detection using Silicon Micro/Nano mechanical devices with Integrated Strain Gauge Readout

Place: IEEE NEMS 2008. Sanya, China
6 Jan 20089 Jan 2008

Conference

Conference2008 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems
Number3
CountryChina
CitySanya
Period06/01/200809/01/2008
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ID: 133643477