Accurate micro Hall Effect measurements on scribe line pads, Proceedings of the 17th IEEE ØInternational Conference on Advanced Thermal Processing of Semiconductors, RTP 2009 - DTU Orbit

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Accurate micro Hall Effect measurements on scribe line pads, Proceedings of the 17th IEEE ØInternational Conference on Advanced Thermal Processing of Semiconductors, RTP 2009

Activity: Lecture and oral contribution

From the same researcher

Four-Point Probe Measurements on Inhomogeneouse Samples: A probe spacing Dependence Study, Proceedings of the 17the IEEE International Conference on Advanced Thermal Processing of Semiconductors, RTP 2009
Activity: Lecture and oral contribution

Fei Wang - Speaker, 29 Sep 2009 → 2 Oct 2009

Place: New York

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